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Characterization of Si and CdTe sensor layers in Medipix assemblies using a microfocus x-ray source
Conference proceeding

Characterization of Si and CdTe sensor layers in Medipix assemblies using a microfocus x-ray source

R. Aamir, N. G. Anderson, A. P. H. Butler, P. H. Butler, S. P. Lansley, R. M. Doesburg, M. Walsh, J. L. Mohr and IEEE
2011 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (NSS/MIC), pp.4766-4769
IEEE Nuclear Science Symposium and Medical Imaging Conference
01/01/2011
DOI: https://doi.org/10.1109/NSSMIC.2011.6154711
Handle:
https://hdl.handle.net/10523/39733

Abstract

Engineering Engineering, Electrical & Electronic Imaging Science & Photographic Technology Life Sciences & Biomedicine Physical Sciences Physics Physics, Applied Radiology, Nuclear Medicine & Medical Imaging Science & Technology Technology
Medipix2 assemblies with Si and CdTe sensors have been characterized using poly-energetic x-ray sources. This work reports the results of inhomogeneities within the sensors; individual pixel sensitivity response and their saturation effects at higher photon fluxes over one hundred frames. At higher tube currents saturation of both sensors is observed. We have performed correction for these inhomogeneities on both sensors. CT images with CdTe-Medipix2 are presented.

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