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Estimation of contour parameter uncertainties in permittivity imaging using MCMC sampling
Conference proceeding

Estimation of contour parameter uncertainties in permittivity imaging using MCMC sampling

C. Schwarzl, D. Watzenig and C. Fox
2008 5th IEEE Sensor Array and Multichannel Signal Processing Workshop, pp.446-450
07/2008

Abstract

Current measurement Electrodes Finite element methods Materials Mathematical model Permittivity measurement Shape

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