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Flexible gamma process degradation modeling with Bernstein basis approximation of shape functions
Journal article   Peer reviewed

Flexible gamma process degradation modeling with Bernstein basis approximation of shape functions

Kai Song, Xun Xiao and Zhi-Sheng Ye
Reliability engineering & system safety, Vol.267(Part B), 111970
18/11/2025
Handle:
https://hdl.handle.net/10523/48996

Abstract

Bernstein bases Degradation Estimation Gamma process Reliability

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