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Measuring Identification and Quantification Errors in Spectral CT Material Decomposition
Journal article   Open access   Peer reviewed

Measuring Identification and Quantification Errors in Spectral CT Material Decomposition

Aamir Younis Raja, Mahdieh Moghiseh, Christopher J. Bateman, Niels de Ruiter, Benjamin Schon, Nanette Schleich, Tim B. F. Woodfield, Anthony P. H. Butler and Nigel G. Anderson
Applied sciences, Vol.8(3), p.467
01/03/2018
Handle:
https://hdl.handle.net/10523/26960

Abstract

Chemistry Chemistry, Multidisciplinary Engineering Engineering, Multidisciplinary Materials Science Materials Science, Multidisciplinary Physical Sciences Physics Physics, Applied Science & Technology Technology
url
https://doi.org/10.3390/app8030467View
Published (Version of record) Open

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